Crystallographic analysis of the lattice metric (<i>CALM</i>) from single electron backscatter diffraction or transmission Kikuchi diffraction patterns

A new software is presented for the determination of crystal lattice parameters from positions and widths Kikuchi bands in a diffraction pattern. Starting with single wide-angle pattern arbitrary resolution unknown phase, traces all visibly diffracting planes are manually derived four initial band via an intuitive graphical user interface. bandwidth then used as reference to scale reciprocal point distances. detection, filtered Funk transformation, simultaneous display intensity profile helps users select widths. Bandwidths calculated using first derivative profiles excess-deficiency effects have minimal influence. From lattice, metrics possible Bravais types systems. The measured achieve precision &lt;1%, even good quality patterns 400 × 300 pixels. This band-edge detection approach has been validated on several hundred experimental phases different symmetries random orientations. It produces systematic parameter offset up ±4%, which appears mean atomic number or backscatter coefficient.